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- 6 reliability
- 2 bias temperature instability (bti)
- 2 gate stack defects
- 1 availability and serviceability
- 1 berkeley short-channel igfet mode...
- 1 bias temperature instability
- 1 checkpoint/restart (c/r)
- 1 circuit simulations
- 1 defects per million (dpm)
- 1 dependability
- 1 dynamic voltage and frequency sca...
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