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- 2 bias temperature instability (bti)
- 1 berkeley short-channel igfet mode...
- 1 circuit simulations
- 1 defects per million (dpm)
- 1 failures in time rate (fit rate).
- 1 functional yield
- 1 mean time to failure (mttf)
- 1 random telegraph noise (rtn)
- 1 simulation pro- gram with integra...
- 1 static random access memory (sram)
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